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139 pages • missing pub info (editions)
ISBN/UID: 9781598299410
Format: Paperback
Language: English
Publisher: Morgan & Claypool
Publication date: 16 March 2009
Description
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block ci...
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139 pages • missing pub info (editions)
ISBN/UID: 9781598299410
Format: Paperback
Language: English
Publisher: Morgan & Claypool
Publication date: 16 March 2009
Description
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block ci...
Community Reviews
Content Warnings