Design, Analysis and Test of Logic Circuits Under Uncertainty by Smita Krishnaswamy, John P. Hayes, Igor L. Markov

Design, Analysis and Test of Logic Circuits Under Uncertainty

Lecture Notes in Electrical Engineering

Smita Krishnaswamy, John P. Hayes, Igor L. Markov

124 pages • missing pub info (editions)

nonfiction art computer science design science technology medium-paced
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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of...

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