Scan barcode
100 pages • missing pub info (editions)
ISBN/UID: 9783844382778
Format: Paperback
Language: English
Publisher: LAP Lambert Academic Publishing
Publication date: 01 June 2011
Description
In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technolog...
Community Reviews
Content Warnings
100 pages • missing pub info (editions)
ISBN/UID: 9783844382778
Format: Paperback
Language: English
Publisher: LAP Lambert Academic Publishing
Publication date: 01 June 2011
Description
In this thesis leakage reduction techniques like stack forcing, multiple threshold CMOS, variable threshold CMOS are explored, that mitigate leakage in circuits, operating in the active mode at various temperatures. Also, implications of technolog...
Community Reviews
Content Warnings