Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications by Moises Padilla, J. Antonio Quiroga, Manuel Servin

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Moises Padilla, J. Antonio Quiroga, Manuel Servin

344 pages • missing pub info (view editions)

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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical ...

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