You need to sign in or sign up before continuing.
Scan barcode
192 pages • missing pub info (editions)
ISBN/UID: 9789400777804
Format: Hardcover
Language: English
Publisher: Springer
Publication date: 28 November 2013
Description
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple facto...
Community Reviews
Content Warnings
192 pages • missing pub info (editions)
ISBN/UID: 9789400777804
Format: Hardcover
Language: English
Publisher: Springer
Publication date: 28 November 2013
Description
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple facto...
Community Reviews
Content Warnings