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172 pages • missing pub info (editions)
ISBN/UID: 9783847328278
Format: Paperback
Language: English
Publisher: LAP Lambert Academic Publishing
Publication date: 09 February 2012
Description
Scanning gate microscopy (SGM), developed in the late 1990's, has become a powerful tool to investigate the local electronic properties in semiconductor nano devices. SGM is based on the AFM technique but the metallic tip is used as a movable gate...
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172 pages • missing pub info (editions)
ISBN/UID: 9783847328278
Format: Paperback
Language: English
Publisher: LAP Lambert Academic Publishing
Publication date: 09 February 2012
Description
Scanning gate microscopy (SGM), developed in the late 1990's, has become a powerful tool to investigate the local electronic properties in semiconductor nano devices. SGM is based on the AFM technique but the metallic tip is used as a movable gate...
Community Reviews
Content Warnings