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David C. Joy, Joseph Goldstein, Dale E. Newbury
689 pages • missing pub info (view editions)
ISBN/UID: 9780306472923
Format: Hardcover
Language: English
Publisher: Springer
Edition Pub Date: 30 April 2007
Description
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. Th...
Community Reviews
Content Warnings
—
David C. Joy, Joseph Goldstein, Dale E. Newbury
689 pages • missing pub info (view editions)
ISBN/UID: 9780306472923
Format: Hardcover
Language: English
Publisher: Springer
Edition Pub Date: 30 April 2007
Description
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. Th...
Community Reviews
Content Warnings