Thermal Testing of Integrated Circuits by Antonio Rubio, J. Altet

Thermal Testing of Integrated Circuits

Antonio Rubio, J. Altet

204 pages missing pub info (editions)

nonfiction art technology medium-paced
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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of th...

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