Cher Ming Tan

3 books

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan, Wei Li, Zhenghao Gan

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Springer Series in Reliability Engineering

Cher Ming Tan, Wei Li, Zhenghao Gan

150 pages • missing pub info (editions)

nonfiction art mathematics technology medium-paced
Electromigration in ULSI Interconnections by Cher Ming Tan

Electromigration in ULSI Interconnections

International Series on Advances in Solid State Electronics and Technology (Unnumbered)

Cher Ming Tan

291 pages • missing pub info (editions)

nonfiction art technology medium-paced
Electromigration Modeling at Circuit Layout Level by Cher Ming Tan, Feifei He

Electromigration Modeling at Circuit Layout Level

Cher Ming Tan, Feifei He

103 pages • missing pub info (editions)

nonfiction art science technology medium-paced
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