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160 pages • missing pub info (view editions)
ISBN/UID: 9781461288190
Format: Paperback
Language: English
Publisher: Springer
Edition Pub Date: 26 September 2011
Description
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate i...
Community Reviews
Content Warnings
160 pages • missing pub info (view editions)
ISBN/UID: 9781461288190
Format: Paperback
Language: English
Publisher: Springer
Edition Pub Date: 26 September 2011
Description
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate i...
Community Reviews
Content Warnings