Browse editions

Current edition
Hierarchical Modeling for VLSI Circuit Testing by Debashis Bhattacharya, John P. Hayes

Hierarchical Modeling for VLSI Circuit Testing

The Springer International Engineering and Computer Science

Debashis Bhattacharya, John P. Hayes

160 pages • missing pub info (editions)

nonfiction computer science design informative medium-paced
Other editions (1)
Expand filter menu Filter editions
Hierarchical Modeling for VLSI Circuit Testing by Debashis Bhattacharya, John P. Hayes

Hierarchical Modeling for VLSI Circuit Testing

The Springer International Engineering and Computer Science

Debashis Bhattacharya, John P. Hayes

160 pages • missing pub info (editions)

nonfiction computer science design informative medium-paced