Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • missing pub info (editions)

nonfiction art design technology informative medium-paced
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Description

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits h...

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