Manoj Sachdev

2 books

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • hardcover

nonfiction art design technology informative medium-paced
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test by Andrei Pavlov, Manoj Sachdev

CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test

Frontiers in Electronic Testing

Andrei Pavlov, Manoj Sachdev

194 pages • paperback

nonfiction art computer science science technology medium-paced