José Pineda de Gyvez

3 books

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • hardcover

nonfiction art design technology informative medium-paced
Integrated Circuit Defect-Sensitivity: Theory and Computational Models by José Pineda de Gyvez

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

The Springer International Engineering and Computer Science

José Pineda de Gyvez

167 pages • hardcover

nonfiction art technology informative medium-paced
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration by Amir Zjajo, José Pineda de Gyvez

Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration

Analog Circuits and Signal Processing

Amir Zjajo, José Pineda de Gyvez

293 pages • paperback

nonfiction art computer science design technology medium-paced