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Current edition

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • hardcover

nonfiction art design technology informative medium-paced

nonfiction art design technology informative medium-paced

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • hardcover

nonfiction art design technology informative medium-paced

nonfiction art design technology informative medium-paced

Other editions (1)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • paperback (editions)

nonfiction art design technology informative medium-paced

nonfiction art design technology informative medium-paced

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by José Pineda de Gyvez, Manoj Sachdev

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

328 pages • paperback

nonfiction art design technology informative medium-paced

nonfiction art design technology informative medium-paced

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